Prognostic Health Management for Electronics
Prognostics Health Management (PHM) is the interrogation of system state and the assessment of product survivability in deployed systems using non-destructive assessment of underlying damage. System health is generally assessed in the actual operating environment. The prior stress history to which the system may have been subjected may not be known in several cases. Prognostics Health Management is very different from reliability prediction, which often assumes pristine materials and uses models that require definitive specification of environmental loads.
Figure 1: Approach for PHM for Thermo-mechanics, Shock and Vibration Environments
Recently, PHM has emerged as a key enabling technology for providing an early warning of failure. Early warnings may be used to forecast planned maintenance and assess the potential for life extensions. PHM has been applied to machines, aircrafts, bridges, electronics, and bio-implantable systems. Avionic systems require ultra-high reliability operation with minimal downtime. Automotive safety features such as anti-lock braking, airbags, and collision avoidance systems depend on the electronics utilized for their performance and reliability. Implantable biological systems are often life sustaining in nature. Deployed electronic systems often may be subjected to multiple thermal environments. Thermal environments may change due to operational factors or changes in usage profiles. Decision support for re-deployment requires PHM-based methods for assessment of the operational readiness of electronic systems, which is based on accrued damage and residual life in the intended environment. PHM will enable self-cognizant systems capable of assessing their own real-time performance under actual usage conditions and adaptively trigger risk mitigation actions to virtually eliminate unplanned failures.
Representative Recent Publications
Lall, P., Thomas, T., Blecker, K., Prognostic and RUL Estimations of SAC105, SAC305 and SnPb Solders under Different Drop and Shock Loads using Long Short-Term Memory (LSTM) Deep Learning Technique, in Proceedings of the 2021 IEEE 20th Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, pp. 644-658, June 1-4, 2021.
Lall, P., Thomas, T., Blecker, K., Feature Vector Identification and Prognostics of SAC305 PCBs for Varying G-Levels of Drop and Shock Loads, in Proceedings of the 2021 IEEE 20th Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, pp. 659-669, June 1-4, 2021.
Lall, P., Thomas, T., Blecker, K., Health monitoring and feature vector identification of failure for SAC305 Solder PCBs under shock loads up to 10,000g, in Proceedings of the 2020 IEEE 19th Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, pp. 932-944, July 21-23, 2020.
Lall, P., Thomas, T., Lall, P., Zhang, H., Prognostication of Remaining Useful-Life for Flexible Batteries in Foldable Wearable Electronics, in Proceedings of the 2019 IEEE 18th Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, pp. 923-932, Las Vegas, NV, May 28-31, 2019.
Lall, P., Zhang, H., Prognostication of Remaining Useful-Life for Flexible Batteries in Foldable Wearable Electronics, Proceedings of the IEEE 2016 International Conference on Prognostics and Health Management (ICPHM2016), Ottawa, ON, pp. 1-10, June 20-22, 2016.
Lall, P., Deshpande, S., Nguyen, L., ANN Based RUL Assessment for Copper-Aluminum Wirebonds Subjected to Harsh Environments, Proceedings of the IEEE 2016 International Conference on Prognostics and Health Management (ICPHM2016), Ottawa, ON, pp. 1-10, June 20-22, 2016.
Lall, P., Deshpande, S., Nguyen, L., Prognostication of Cu-Al WB System Subjected to High Temperature-Humidity Condition, Proceedings of the ITHERM 2016, Las Vegas, Nevada, pp. 887- 898, May 31- June 3, 2016.
Lall, P., Lowe, R., Comparison of Prognostic Health Management Algorithms for Assessment of Electronic Reliability Under Vibration, ASME Journal of Electronic Packaging, Volume 136, No. 4, doi:10.1115/1.4028163, pp. 1-8, December 2014.
Lall, P., Lowe, R., Goebel, K., Prognostic Health Monitoring for a Micro-Coil Spring Interconnect Subjected to Drop Impacts, IEEE International Conference on Prognostics and Health Management, Gaithersburg, MD, pp. 1-11, June 24-27, 2013.
Lall, P., Lowe, R., Goebel, K., Prognostication Based on Resistance-Spectroscopy and Phase-Sensitive Detection for Electronics Subjected to Shock-Impact, ASME J. Electron. Packag. 134, 021001-1 to 021001-10, 2012.
Lall, P., Gupta, P., Angral, A., Anomaly Detection and Classification for PHM of Electronics Subjected to Shock and Vibration, IEEE Transactions On Components, Packaging And Manufacturing Technology, DOI: 10.1109/TCPMT.2012.2207460 , Vol. 2, No. 11, pp. 1902-1918, 2012.
Lall, P., Lowe, R., Goebel, K., Extended Kalman Filter Models and Resistance Spectroscopy for Prognostication and Health Monitoring of Leadfree Electronics Under Vibration, IEEE Transactions on Reliability, DOI: 10.1109/TR.2012.2220698, Vol. 61, No. 4, pp. 858-871, 2012.
Lall, P., Lowe, R., Goebel, K., Prognostics Health Management of Electronic Systems Under Mechanical Shock and Vibration Using Kalman Filter Models and Metrics, IEEE Transactions On Industrial Electronics, Vol. 59, No. 11, November 2012.
Lall, P., Lowe, R., Goebel, K., Cost Assessment for Implementation of Embedded Prognostic Health Management For Electronic Systems, Proceedings of the ASME 2012 International Mechanical Engineering Congress & Exposition (IMECE2012), Paper Number IMECE2012-93058, pp. 1-11, Houston, Texas, November 9-15, 2012.
Lall, P., Lowe, R. Goebel, K., Particle Swarm Optimization with Extended Kalman Filter for Prognostication of Accrued Damage in Electronics Under Temperature and Vibration, IEEE PHM Conference, Denver, CO, June 18-21, 2012.