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| Research Area: Connector Reliability | | In this research area, the effects of vibration and environment on the performance of automotive and other harsh environment connectors are being evaluated. The primary goals are to examine connector interconnection options for next generation extreme environment applications and to establish the reliability and failure mechanisms. A basic understanding of the causes of fretting corrosion is being established, and then utilized to develop strategies for the accelerated testing of connectors. In addition, the growth of tin whiskers is being studied on connector pins with lead free plating finishes. The ongoing tin whisker research includes both fundamental studies on the origin of whisker growth and experimental test matrices to examine next generation connector designs. Deliverables from our Connector Reliability research include design guidelines, modeling tools, reliability data, and processing recommendations.
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| | Personnel | Research Area Information |
George T. Flowers (Research Leader)
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